Calibration of atomic‐force microscope tips
JL Hutter, J Bechhoefer - Review of scientific instruments, 1993 - pubs.aip.org
Images and force measurements taken by an atomic‐force microscope (AFM) depend
greatly on the properties of the spring and tip used to probe the sample's surface. In this
article, we describe a simple, nondestructive procedure for measuring the force constant,
resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of
curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional
equipment.
greatly on the properties of the spring and tip used to probe the sample's surface. In this
article, we describe a simple, nondestructive procedure for measuring the force constant,
resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of
curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional
equipment.